18923764396
取消

SNJ54BCT8374AFK

零件编号 SNJ54BCT8374AFK
产品分类 专业逻辑
制造商 Texas Instruments
描述 SCAN TEST DEVICES WITH OCTAL D-T
封装
包装 管子
数量 0
RoHS 状态 YES
分享
产品参数
PDF(1)
类型描述
制造商Texas Instruments
系列54BCT
包装管子
产品状态ACTIVE
包装/箱28-CLCC
安装类型Surface Mount
位数8
逻辑类型Scan Test Device with D-Type Edge-Triggered Flip-Flops
工作温度-55°C ~ 125°C
电源电压4.5V ~ 5.5V
供应商设备包28-LCCC (11.43x11.43)

Panasonic Electronic Components
RES SMD 1.1K OHM 5% 1/8W 0805
Panasonic Electronic Components
RES SMD 2.4K OHM 5% 1/8W 0805
Panasonic Electronic Components
RES SMD 1.5K OHM 5% 1/8W 0805
Panasonic Electronic Components
RES SMD 3K OHM 5% 1/8W 0805
Roving Networks (Microchip Technology)
IC EEPROM 1KBIT MICROWIRE 8SOIC
Omron Electronic Components
SENSOR OPT REFLECTIVE 5MM 5DIP
Sullins Connector Solutions
CONN HEADER VERT 1POS
Sullins Connector Solutions
CONN HEADER VERT 1POS
Sullins Connector Solutions
CONN HEADER VERT 2POS
Sullins Connector Solutions
CONN HEADER R/A 2POS
关闭
Inquiry
captcha

18923764396

点击这里给我发消息
0
1.173267s